Optical spectral characterization—rapid, reliable and repeatable
A continuously tunable laser is an essential instrument in R&D labs and on production floors. It covers a variety of applications where rapid, continuous wavelength tuning is required. The T500S offers excellent wavelength coverage, delivers speed and high power while sweeping. The laser also shows excellent linewidth characteristics when operated at fixed wavelength.
Testing high-speed photonic integrated circuits (PICs)
Integrated photonics can include complex optical components with high-contrast spectrum. For instance, a ring resonator may have very sharp features making it difficult to characterize insertion loss. Furthermore, some devices also require extended measurements of return loss or polarization dependent loss, with the same level of precision. Finally, simultaneous testing of many devices or outputs from one single device is also required to speed up PIC characterization. To test such devices, the T500S laser can be jointly operated with the CTP10, EXFO’s component testing platform. With high-resolution and high-accuracy spectral measurement, the CTP10 is an integrated solution that leverages the full potential of the T500S for operations at 200 nm/s sweep speed with bidirectional scanning. The T500S is also compatible with the CT440, EXFO’s compact component tester operating at 100 nm/s.
Industry-leading features
14-dBm peak output power with high spectral purity: Laser exhibits a crystal-clear optical spectrum with a peak output power of 14 dBm. Optical cavity eliminates broadband source spontaneous emission (SSE) without any compromise on optical power. High spectral purity is maintained throughout the laser sweep through active mode-hop control, ensuring reliable and repeatable wavelength sweeps.
High-speed tunability: Can be configured with a bidirectional scanning speed of 200 nm/s. When speed is critical, the T500S ensures repeatable yet fast measurements. Otherwise, the laser can be set to slower scanning speeds (e.g., for legacy detection systems).
Step-by-step or continuously swept wavelength scans: Two user modes at hand, optimized for specific usage: TUNE or SWEEP. With TUNE, laser control ensures excellent linewidth at any wavelength or provides rapid “go-to” wavelength tuning. SWEEP performs high-speed mode-hop-free scans over the full wavelength range of the laser.
Compact and easy to use
The half-rack configuration makes the T500S an attractive device for lab applications, with limited footprint. The screen can be adjusted to suit dark optical lab environments and display relevant information so that you can see them from the other side of the optical bench. A rackmount accessory is available to mount one or two lasers inside a 19-in rack bench. With control buttons situated at each screen corner, the laser can be operated without even looking at the screen.
Features
- Bidirectional sweeps with speeds up to 200 nm/s
- 14-dBm peak optical power output
- Excellent SSSER
- Six models covering 1240 nm – 1680 nm
- Wavelength tuning and continuous sweep modes
- Active mode-hop-free operation
Optical spectral characterization—rapid, reliable and repeatable
A continuously tunable laser is an essential instrument in R&D labs and on production floors. It covers a variety of applications where rapid, continuous wavelength tuning is needed. The T200S delivers speed and high power while sweeping, in addition to excellent linewidth at fixed wavelength.
Testing high-speed photonic integrated circuits (PICs)
Integrated photonics can include complex optical components with high-contrast spectrum. For instance, a ring resonator may have very sharp features making it difficult to characterize insertion loss. In addition to insertion loss, some devices require extended measurements of return loss or polarization dependent loss, with the same level of precision. Finally, simultaneous testing of many devices or outputs from one single device is also required to speed up PIC characterization. To test such devices, the T200S laser can be jointly operated with the CTP10, EXFO’s component testing platform. With high-resolution and high-accuracy spectral measurement, the CTP10 is an integrated solution that leverages the full potential of the T200S for operations at 200 nm/s sweep speed. The T200S is also compatible with the CT440, EXFO’s compact component tester operating at 100 nm/s.
Industry-leading features
10 dBm output power with high spectral purity: Laser exhibits a crystal-clear optical spectrum at a nominal optical output power of 10 dBm over the entire tuning range. Optical cavity eliminates broadband source spontaneous emission (SSE) without any compromise on optical power. High spectral purity is maintained throughout the laser sweep through active mode-hop control, ensuring reliable and repeatable wavelength sweeps.
High-speed tunability: Laser scanning speed is 100 nm/s and can be configured with an optional 200 nm/s scanning speed. When speed is critical, the T200S ensures repeatable yet fast measurements. Otherwise, the laser can be set to slower scanning speeds (e.g., for legacy detection systems)."
Step-by-step or continuously swept wavelength scans: Two user modes at hand, optimized for specific usage: TUNE or SWEEP. With TUNE, laser control ensures excellent linewidth at any wavelength or provides rapid “go-to” wavelength tuning. SWEEP performs high-speed mode-hop-free scans over the full wavelength range of the laser.
Compact and easy to use
The half-rack configuration makes the T200S an attractive device for lab applications, with limited footprint. The screen can be adjusted to suit dark optical lab environments and display relevant information so that you can see them from the other side of the optical bench. A rackmount accessory is available to mount one or two lasers inside a 19-in rack bench. With control buttons situated at each screen corner, the laser can be operated without even looking at the screen.
Features
- Up to 200 nm/s scanning speed
- 10 dBm over tunable spectral range
- Excellent SSSER
- Wavelength coverage: O and CL bands
- Wavelength tuning and continuous sweep modes
- Active mode-hop-free operation
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